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Dimethicone Semiconductor Glass BiVO4 LateralForceMicroscopy PrCurve lithography mono_layer semifluorinated_alkanes Mobile NUS_NNI_Nanocore Implant ConductingPolymer Inorganic_Compound Lattice PatternedSapphireSubstrat H-BN CastIron ThermalDetectors OpticalElement light_emitting Potential atomic_layer Magnetic Force Microscopy CaMnO3 Crystal MechanicalProperties FailureAnalysis Regensburg Leakage high_resolution Sic MagneticForce Varistor PhaseChange
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Block copolymer Ι
Scanning Conditions
- System: NX20
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.8Hz
- Pixel: 512×512
- Scan Mode: Tapping
- Cantilever: AC160TS (k=26N/m, f=300kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 0.8Hz
- Pixel: 512×512