-
high_resolution BiasMode Solution Magnetostrictive SurfaceOxidation temperature controller AFM Polytetrafluoroethylene graphene_hybrid Heating hetero_structure PVA thermal_conductivity Jason TransitionMetal StrontiuTitanate Leakage semifluorinated alkane ForceVolume suspended_graphene aluminum_nitride Scanning_Thermal_Microscopy SICM Polyurethane Friction OpticalElement Fiber Titanate SiliconCrystal Writing light_emitting Subhajjit InLiquid LMF Hole ScanningIon-ConductanceMicroscopy
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Co/Cr/Pt
Scanning Conditions
- System: NX10
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Lift height: 40nm
- Scan Mode: MFM
- Cantilever: PPP-MFMR (k=2.8N/m, f=75kHz)
- Scan Size: 5μm×5μm
- Scan Rate: 1Hz
- Pixel: 512×512
- Lift height: 40nm