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Roughness Transparent Pzt Force-distance MfmPhase Tin sulfide Mechanical Cancer NTU Ram PrCurve high_resolution CrAu Conduct Conductance molecule SurfaceChange F14H20 semifluorinated_alkane PS_LDPE PMNPT PiezoelectricForceMicroscopy fifber HafniumDioxide LiquidCell Etch PolyvinylAcetate AtomicSteps LaAlO3 Vinylpyridine light_emission plastics FrictionalForce MfmAmplitude ContactModeDots
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Polymer patterns on Si (2/2)
Scanning Conditions
- System: NX10
- Scan Mode: KPFM
- Cantilever: NSC36Cr-Au (k=1N/m, f=90kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 0.2Hz
- Pixel: 512×256