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MolecularSelfAssembly CeramicCapacitor Stiffness MeltingPoint PatternedSapphireSubstrat Aluminium_Oxide Current Calcite light_emitting Thermal PpLdpe MBE Morphology PS_PVAC Yeditepe CuParticle Fluoride exfoliate amplitude_modulation KPFM AdhesionEnergy PinpointPFM CntFilm Sapphire MoirePattern Polyethylene mechanical_property TiO2 Annealing Protein SThM Wafer PinPointMode LiquidCrystal lift_mode
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Lithography on Si substrate
Scanning Conditions
- System: NX10
- Scan Mode: Lithography
- Cantilever: ContscPt (k=0.2N/m, f=25kHz)
- Scan Size: 10μm×10μm
- Scan Rate: 1Hz
- Pixel: 1024×512
- Litho. mode: Tip bias mode
- Litho. Tip bias: Black -10V, White 0V