-
plastic LiIonBattery Monisha dielectric trench FAFailureAnlaysis DNAProtein PS_PVAC Bio Piezoelectric Gallium Optoelectonics ElectroChemical Melt AdhesionEnergy HighResolution Sperm CuSubstrate Lateral_Force_Microscopy CrossSection Polyvinylidene Composite silicon_carbide Polarization Ni81Fe19 Treatment HiVacuum AlkaneFilm Fiber Metal epitaxy Anneal VinylAlcohol CuFoil Change BoronNitride
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
SRAM
Scanning Conditions
- System: NX10
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V
- Scan Mode: CP-AFM
- Cantilever: CDT-NCHR (k=80N/m, f=400kHz)
- Scan Size: 3μm×3μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Sample Bias: 0.5V