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Lateral_Force_Microscopy Modulus FM_SKPM NCM dielectric_trench OpticalWaveguides Wang Blend KevlarFiber ElectroDeposition Indent FAFailureAnlaysis Temasek_Lab Bmp AdhesionForce AtomicSteps Gong Lattice ConductingPolymer multi_layer C36H74 Composition Alkane PVAP3HT UnivOfMaryland MagneticForce biocompatible Multiferroic_materials Polyurethane Sic KAIST layers Copolymer CarbonNanotube self_assembly
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Lithography on compact disk
Scanning Conditions
- System: NX10
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256
- Scan Mode: XEL
- Cantilever: NCHR (k=42N/m, f=300kHz)
- Scan Size: 7.5μm×7.5μm
- Scan Rate: 0.5Hz
- Pixel: 256×256